Back to Search Start Over

Development and characterization of a novel wheat-rye T2DSĀ·2DL-2RL translocation line with high stripe rust resistance.

Authors :
Ji, Yuzhou
Han, Guohao
Gong, Wenping
Han, Ran
Wang, Xiaolu
Bao, Yinguang
Li, Jianbo
Liu, Aifeng
Li, Haosheng
Liu, Jianjun
Ma, Pengtao
Liu, Cheng
Source :
Phytopathology Research. 11/7/2024, Vol. 6 Issue 1, p1-10. 10p.
Publication Year :
2024

Abstract

Rye (Secale cereale L.), a close relative of common wheat, represents a valuable genetic resource for enhancing the disease resistance of common wheat. Introducing novel rye-derived genes into wheat can potentially improve disease resistance. In this study, we successfully developed a novel wheat-rye derivative line LCR4 through hybridization between hexaploid triticale line Currency and common wheat cultivar Jimai 22 (JM22). We confirmed that LCR4 was a T2DS·2DL-2RL translocation line via comprehensive molecular cytogenetic analyses, including genomic in situ hybridization, multi-color fluorescence in situ hybridization, molecular marker analysis, and wheat SNP-arrays genotyping. Notably, upon inoculation with Puccinia striiformis f. sp. tritici (Pst) race V26 at the seedling stage and mixed Pst races at the adult stage, LCR4 exhibited robust resistance against stripe rust infection at both stages. Subsequent genetic analysis further elucidated that the translocated 2RL chromosome segment is responsible for this resistance. Consequently, LCR4 harboring elite agronomic traits can be effectively employed in breeding programs against stripe rust. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
20965362
Volume :
6
Issue :
1
Database :
Academic Search Index
Journal :
Phytopathology Research
Publication Type :
Academic Journal
Accession number :
180736269
Full Text :
https://doi.org/10.1186/s42483-024-00281-6