Characteristics of Fully-Depleted Poly-Si Thin Film Transistors Operated in Above-Threshold Region with Low Drain Bias.

MLA

Zhu, Zhen, and Junhao Chu. “Characteristics of Fully-Depleted Poly-Si Thin Film Transistors Operated in Above-Threshold Region with Low Drain Bias.” IETE Journal of Research, vol. 70, no. 9, Sept. 2024, pp. 7463–68. EBSCOhost, https://doi.org/10.1080/03772063.2024.2353345.

APA

Zhu, Z., & Chu, J. (2024). Characteristics of Fully-Depleted Poly-Si Thin Film Transistors Operated in Above-Threshold Region with Low Drain Bias. IETE Journal of Research, 70(9), 7463–7468. https://doi.org/10.1080/03772063.2024.2353345

Chicago

Zhu, Zhen, and Junhao Chu. 2024. “Characteristics of Fully-Depleted Poly-Si Thin Film Transistors Operated in Above-Threshold Region with Low Drain Bias.” IETE Journal of Research 70 (9): 7463–68. doi:10.1080/03772063.2024.2353345.