Cite
Quantitative Scanning Transmission Electron Microscopy–High‐Angle‐Annular Dark‐Field Study of the Structure of Pseudo‐2D Sb2Te3 Films Grown by (Quasi) Van der Waals Epitaxy.
MLA
Sever, Vitomir, et al. “Quantitative Scanning Transmission Electron Microscopy–High‐Angle‐Annular Dark‐Field Study of the Structure of Pseudo‐2D Sb2Te3 Films Grown by (Quasi) Van Der Waals Epitaxy.” Physica Status Solidi - Rapid Research Letters, vol. 18, no. 10, Oct. 2024, pp. 1–11. EBSCOhost, https://doi.org/10.1002/pssr.202300402.
APA
Sever, V., Bernier, N., Térébénec, D., Sabbione, C., Paterson, J., Castioni, F., Quéméré, P., Jannaud, A., Rouvière, J., Roussel, H., Raty, J., Hippert, F., & Noé, P. (2024). Quantitative Scanning Transmission Electron Microscopy–High‐Angle‐Annular Dark‐Field Study of the Structure of Pseudo‐2D Sb2Te3 Films Grown by (Quasi) Van der Waals Epitaxy. Physica Status Solidi - Rapid Research Letters, 18(10), 1–11. https://doi.org/10.1002/pssr.202300402
Chicago
Sever, Vitomir, Nicolas Bernier, Damien Térébénec, Chiara Sabbione, Jessy Paterson, Florian Castioni, Patrick Quéméré, et al. 2024. “Quantitative Scanning Transmission Electron Microscopy–High‐Angle‐Annular Dark‐Field Study of the Structure of Pseudo‐2D Sb2Te3 Films Grown by (Quasi) Van Der Waals Epitaxy.” Physica Status Solidi - Rapid Research Letters 18 (10): 1–11. doi:10.1002/pssr.202300402.