Cite
Microstrain in Al0.22Ga0.78N/GaN heterostructure studied by X-ray diffraction and scattering
MLA
Tan, W. S., et al. “Microstrain in Al0.22Ga0.78N/GaN Heterostructure Studied by X-Ray Diffraction and Scattering.” Journal of Alloys & Compounds, vol. 397, no. 1/2, July 2005, pp. 231–35. EBSCOhost, https://doi.org/10.1016/j.jallcom.2004.11.072.
APA
Tan, W. S., Cai, H. L., Wu, X. S., Jiang, S. S., Zheng, W. L., & Jia, Q. J. (2005). Microstrain in Al0.22Ga0.78N/GaN heterostructure studied by X-ray diffraction and scattering. Journal of Alloys & Compounds, 397(1/2), 231–235. https://doi.org/10.1016/j.jallcom.2004.11.072
Chicago
Tan, W.S., H.L. Cai, X.S. Wu, S.S. Jiang, W.L. Zheng, and Q.J. Jia. 2005. “Microstrain in Al0.22Ga0.78N/GaN Heterostructure Studied by X-Ray Diffraction and Scattering.” Journal of Alloys & Compounds 397 (1/2): 231–35. doi:10.1016/j.jallcom.2004.11.072.