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Effect of Discharge Gas Composition on SiC Etching in an HFE-347mmy/O 2 /Ar Plasma.

Authors :
You, Sanghyun
Sun, Eunjae
Chae, Heeyeop
Kim, Chang-Koo
Source :
Materials (1996-1944). Aug2024, Vol. 17 Issue 16, p3917. 9p.
Publication Year :
2024

Abstract

This study explores the impact of varying discharge gas compositions on the etching performance of silicon carbide (SiC) in a heptafluoroisopropyl methyl ether (HFE-347mmy)/O2/Ar plasma. SiC is increasingly favored for high-temperature and high-power applications due to its wide bandgap and high dielectric strength, but its chemical stability makes it challenging to etch. This research explores the use of HFE-347mmy as a low-global-warming-potential (GWP) alternative to the conventional high-GWP fluorinated gasses that are typically used in plasma etching. By examining the behavior of SiC etch rates and analyzing the formation of fluorocarbon films and Si-O bonds, this study provides insights into optimizing plasma conditions for effective SiC etching, while addressing environmental concerns associated with high-GWP gasses. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
19961944
Volume :
17
Issue :
16
Database :
Academic Search Index
Journal :
Materials (1996-1944)
Publication Type :
Academic Journal
Accession number :
179350441
Full Text :
https://doi.org/10.3390/ma17163917