Design considerations for a Johann X-ray crystal spectrometer using double reflection in a single crystal to obtain spatially resolved information about a hot plasma seeded with highly charged ions

Abstract: Enhanced confinement regimes with steep gradients of density profiles and the need to place rotation velocity profiles call for maximum spatial resolution in the tokamak plasma. It is proposed to achieve such a resolution by using X-ray spectroscopy with double reflections in single crystals. [Copyright &y& Elsevier]