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Exploring deep fully convolutional neural networks for surface defect detection in complex geometries.

Authors :
García Peña, Daniel
García Pérez, Diego
Díaz Blanco, Ignacio
Juárez, Jorge Marina
Source :
International Journal of Advanced Manufacturing Technology. Sep2024, Vol. 134 Issue 1/2, p97-111. 15p.
Publication Year :
2024

Abstract

In this paper, we propose a machine learning approach for detecting superficial defects in metal surfaces using point cloud data. We compare the performance of two popular deep learning architectures, multilayer perceptron networks (MLPs) and fully convolutional networks (FCNs), with varying feature sets. Our results show that FCNs (F1=0.94) outperformed MLPs (F1=0.52) in terms of precision, recall, and F1-score. We found that transfer learning with pre-trained models can improve performance when the amount of available data is limited. Our study highlights the importance of considering the amount and quality of training data in developing machine learning models for defect detection in industrial settings with 3D images. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
02683768
Volume :
134
Issue :
1/2
Database :
Academic Search Index
Journal :
International Journal of Advanced Manufacturing Technology
Publication Type :
Academic Journal
Accession number :
179041073
Full Text :
https://doi.org/10.1007/s00170-024-14069-7