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An error analysis for deep binary classification with sigmoid loss.

Authors :
Li, Changshi
Jiao, Yuling
Yang, Jerry Zhijian
Source :
Information Sciences. Oct2024, Vol. 681, pN.PAG-N.PAG. 1p.
Publication Year :
2024

Abstract

Deep neural networks have demonstrated remarkable efficacy in diverse classification tasks. In this paper, we specifically focus on the predictive performance in deep binary classification problems with the sigmoid loss. Given that sigmoid loss is categorized as a non-convex and bounded loss function, it exhibits potential resilience against the disruptive impact of outlier noises. We first derive the convergence rate of the excess misclassification risk for deep ReLU neural networks with the sigmoid loss, a result that attains minimax optimality. To the best of our acknowledge, we are the first to derive the convergence rate for the sigmoid loss. Moreover, we extend our analysis to derive a faster convergence rate under margin assumptions. This achievement renders our findings comparable to those of commonly employed convex loss functions operating under analogous assumptions. Lastly, we undertake a comprehensive validation of the robustness inherent in the sigmoid loss across diverse datasets. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00200255
Volume :
681
Database :
Academic Search Index
Journal :
Information Sciences
Publication Type :
Periodical
Accession number :
178885098
Full Text :
https://doi.org/10.1016/j.ins.2024.121166