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Electronic properties and formation energy of chalcogen-doped (S/Se/Te) corundum Al2O3.

Authors :
Liao, Yimin
Song, Hanzhao
Xie, Zhigao
Zhang, Chuang
Han, Zhuolun
Wang, Yan
Tan, Chee-Keong
Source :
Journal of Applied Physics. 8/7/2024, Vol. 136 Issue 5, p1-10. 10p.
Publication Year :
2024

Abstract

α-Al2O3 is renowned for its extensive bandgap and diverse applications in electronic and optoelectronic devices. Employing density-functional theory-based methods, this study investigates the feasibility of chalcogen doping (S, Se, Te) in α-Al2O3. Standard modeling tools are utilized to construct α-Al2O3 supercells, focusing on the calculations of individual chalcogen-related and native point defects resulting from single-atom doping. Our analysis systematically explores the formation energies and transition levels associated with chalcogen (S, Se, Te) doping in oxygen (or aluminum) sites in Al-rich (or O-rich) limits. We observe a trend where increasing atomic number (from S to Te) correlates with a higher difficulty in forming anion-doped α-Al2O3, but a lower barrier to cationic doping. The results indicate a preferential substitution of chalcogen atoms for aluminum in O-rich environments. Specifically, in varying oxygen conditions, the dominant defect types, their prevalence, and defect formation energies in α-Al2O3 are significantly altered following chalcogen doping, offering new insights into defect processes in α-Al2O3. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
136
Issue :
5
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
178879596
Full Text :
https://doi.org/10.1063/5.0207498