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Evasion of wheat resistance gene Lr15 recognition by the leaf rust fungus is attributed to the coincidence of natural mutations and deletion in AvrLr15 gene.

Authors :
Cui, Zhongchi
Shen, Songsong
Meng, Linshuo
Sun, Xizhe
Jin, Yuqing
Liu, Yuanxia
Liu, Daqun
Ma, Lisong
Wang, Haiyan
Source :
Molecular Plant Pathology. Jul2024, Vol. 25 Issue 7, p1-6. 6p.
Publication Year :
2024

Abstract

Employing race‐specific resistance genes remains an effective strategy to protect wheat from leaf rust caused by Puccinia triticina (Pt) worldwide, while the newly emerged Pt races, owing to rapid genetic evolution, frequently overcome the immune response delivered by race‐specific resistance genes. The molecular mechanisms underlying the newly evolved virulence Pt pathogen remain unknown. Here, we identified an avirulence protein AvrLr15 from Pt that induced Lr15‐dependent immune responses. Heterologously produced AvrLr15 triggered pronounced cell death in Lr15‐isogenic wheat leaves. AvrLr15 contains a functional signal peptide, localized to the plant nucleus and cytosol and can suppress BAX‐induced cell death. Evasion of Lr15‐mediated resistance in wheat was associated with a deletion and point mutations of amino acids in AvrLr15 rather than AvrLr15 gene loss in the Lr15‐breaking Pt races, implying that AvrLr15 is required for the virulence function of Pt. Our findings identified the first molecular determinant of wheat race‐specific immunity and facilitated the identification of the first AVR/R gene pair in the Pt–wheat pathosystem, which will provide a molecular marker to monitor natural Pt populations and guide the deployment of Lr15‐resistant wheat cultivars in the field. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
14646722
Volume :
25
Issue :
7
Database :
Academic Search Index
Journal :
Molecular Plant Pathology
Publication Type :
Academic Journal
Accession number :
178646606
Full Text :
https://doi.org/10.1111/mpp.13490