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A Method of Measuring TES Complex ETF Response in Frequency-Domain Multiplexed Readout by Single Sideband Power Modulation.

Authors :
Zhou, Yu
de Haan, Tijmen
Akamatsu, Hiroki
Kaneko, Daisuke
Hazumi, Masashi
Hasegawa, Masaya
Suzuki, Aritoki
Lee, Adrian T.
Source :
Journal of Low Temperature Physics. Jul2024, Vol. 216 Issue 1/2, p73-84. 12p.
Publication Year :
2024

Abstract

The digital frequency-domain multiplexing technique is widely used for astrophysical instruments with large detector arrays. Detailed detector characterization is required for instrument calibration and systematics control. We conduct the TES complex electrothermal-feedback response measurement with the DfMux readout system as follows. By injecting a single sideband signal, we induce modulation in TES power dissipation over a frequency range encompassing the detector response. The modulated current signal induced by TES heating effect is measured, allowing for the ETF response characterization of the detector. With the injection of an upper sideband, the TES readout current shows both an upper and a lower sideband. We model the upper and lower sideband complex ETF response and verify the model by fitting to experimental data. The model not only can fit for certain physical parameters of the detector, such as loop gain, temperature sensitivity, current sensitivity, and time constant, but also enables us to estimate the systematic effect introduced by the multiplexed readout. The method is therefore useful for in situ detector calibration and for estimating systematic effects during astronomical telescope observations, such as those performed by the upcoming LiteBIRD satellite. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00222291
Volume :
216
Issue :
1/2
Database :
Academic Search Index
Journal :
Journal of Low Temperature Physics
Publication Type :
Academic Journal
Accession number :
178623266
Full Text :
https://doi.org/10.1007/s10909-024-03107-z