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Fabrication and characterization of a 2D hole system a in novel (311)A GaAs SISFET

Authors :
Clarke, W.R.
Micolich, A.P.
Hamilton, A.R.
Simmons, M.Y.
Muraki, K.
Hirayama, Y.
Source :
Microelectronics Journal. Mar2005, Vol. 36 Issue 3-6, p327-330. 4p.
Publication Year :
2005

Abstract

Abstract: We demonstrate a novel heterostructure for inducing 2D hole systems in (311)A GaAs–AlGaAs heterostructures that offers advantages over previous methods including low turn on voltages, easier fabrication and good interface roughness. The heterostructure incorporates a metallic p+-GaAs cap layer as an in situ top gate that pins the Fermi energy close to the valence band and can then be used to induce the 2D hole system at the GaAs/AlGaAs interface. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
00262692
Volume :
36
Issue :
3-6
Database :
Academic Search Index
Journal :
Microelectronics Journal
Publication Type :
Academic Journal
Accession number :
17812918
Full Text :
https://doi.org/10.1016/j.mejo.2005.02.073