Cite
Microstructure evolution of oxidized Ni/Au ohmic contacts to p-GaN studied by X-ray diffraction
MLA
Hu, C. Y., et al. “Microstructure Evolution of Oxidized Ni/Au Ohmic Contacts to p-GaN Studied by X-Ray Diffraction.” Materials Science in Semiconductor Processing, vol. 8, no. 4, Aug. 2005, pp. 515–19. EBSCOhost, https://doi.org/10.1016/j.mssp.2004.07.004.
APA
Hu, C. Y., Qin, Z. X., Chen, Z. Z., Yang, H., Wu, K., Wang, Q., Yang, Z. J., Yu, T. J., Hu, X. D., & Zhang, G. Y. (2005). Microstructure evolution of oxidized Ni/Au ohmic contacts to p-GaN studied by X-ray diffraction. Materials Science in Semiconductor Processing, 8(4), 515–519. https://doi.org/10.1016/j.mssp.2004.07.004
Chicago
Hu, C.Y., Z.X. Qin, Z.Z. Chen, H. Yang, K. Wu, Q. Wang, Z.J. Yang, T.J. Yu, X.D. Hu, and G.Y. Zhang. 2005. “Microstructure Evolution of Oxidized Ni/Au Ohmic Contacts to p-GaN Studied by X-Ray Diffraction.” Materials Science in Semiconductor Processing 8 (4): 515–19. doi:10.1016/j.mssp.2004.07.004.