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Polarized Raman Microscopy to Image Microstructure Changes in Silicon Phthalocyanine Thin‐Films.
- Source :
-
Small Science . Jun2024, Vol. 4 Issue 6, p1-1. 1p. - Publication Year :
- 2024
- Subjects :
- *RAMAN microscopy
*MICROSTRUCTURE
*SILICON
Subjects
Details
- Language :
- English
- Volume :
- 4
- Issue :
- 6
- Database :
- Academic Search Index
- Journal :
- Small Science
- Publication Type :
- Academic Journal
- Accession number :
- 177841939
- Full Text :
- https://doi.org/10.1002/smsc.202470017