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Graphene-Infused copper contacts: Achieving ultra-low resistance ohmic interfaces.

Authors :
Mohandoss, Thanigaivelraja
Robert, Femi
Source :
AIP Conference Proceedings. 2024, Vol. 3170 Issue 1, p1-6. 6p.
Publication Year :
2024

Abstract

Contact resistance (Rc) is an extremely significant metric to determine the caliber of ohmic contact which regulates the current flow. This study examines the contact interface of several materials, specifically Copper metal – Copper metal [Cum − Cum], Copper metal – Graphene layer [Cum − Grl], Graphene layer – Graphene layer [Grl − Grl], and Graphene layer coated over Copper metal – Graphene layer [Cum/Grl – Grl]. The COMSOL Multiphysics simulation software is utilized to investigate the electrical and structural analysis of the contact interface. The contact resistance is greatly reduced at the interface of Cum/Grl, increasing current density. Low-resistance ohmic contacts are highly advantageous in many electronic devices such as high electron mobility transistors, MOSFETs, and electromechanical relays. They are beneficial in various applications, from low-power digital logic to high-power scenarios. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
0094243X
Volume :
3170
Issue :
1
Database :
Academic Search Index
Journal :
AIP Conference Proceedings
Publication Type :
Conference
Accession number :
177675796
Full Text :
https://doi.org/10.1063/5.0215814