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Challenges in commissioning the "TSET" technique: A new approach towards monitor unit calculation and beam profile measurements.
- Source :
-
Journal of Cancer Research & Therapeutics . Jan-Mar2024, Vol. 20, p389-395. 7p. - Publication Year :
- 2024
-
Abstract
- Introduction: Total skin electron beam therapy, commonly known as TSET, is a good choice of treatment for patients suffering from mycosis fungoides. The aim of this study was to introduce a new approach to the beam profile measurement using diodes and to calculate the monitor units required for the TSET treatment by the use of a simple setup of output measurement. Dosimetric measurements required for the treatment were taken to establish the Stanford technique in the department, and the measured data was compared with the published data. Materials and Methods: High-energy Linear Accelerator Clinac-DHX, Varian medical system, Palo Alto, CA, was commissioned for TSET. The output of the machine was measured by the use of a Parallel-Plate Chamber (PPC40) as per the TRS 398 recommendation. Diode dosimeters (EDD2 and EDD5) were used for beam profile measurements due to easy setup and to reduce the measurement time. Results: Homogeneous dose distribution within a field size of 80 cm x160 cm was observed with the variation of -5.0% on the horizontal axis and -5.4% on the vertical axis. The calculated monitor unit to deliver 200 cGy per fraction per field at the source to surface (SSD) of 416 cm was 489 MU. Conclusion: The technique described for the output measurements is simple and accurate. Results of the absorbed dose and MU measured were within good agreement compared to the published literature. [ABSTRACT FROM AUTHOR]
- Subjects :
- *MYCOSIS fungoides
*ABSORBED dose
*LINEAR accelerators
*ELECTRON beams
*DOSIMETERS
Subjects
Details
- Language :
- English
- ISSN :
- 09731482
- Volume :
- 20
- Database :
- Academic Search Index
- Journal :
- Journal of Cancer Research & Therapeutics
- Publication Type :
- Academic Journal
- Accession number :
- 177446742
- Full Text :
- https://doi.org/10.4103/jcrt.jcrt_1579_22