Cite
Enhancing ferroelectric characterization at nanoscale: A comprehensive approach for data processing in spectroscopic piezoresponse force microscopy.
MLA
Valloire, H., et al. “Enhancing Ferroelectric Characterization at Nanoscale: A Comprehensive Approach for Data Processing in Spectroscopic Piezoresponse Force Microscopy.” Journal of Applied Physics, vol. 135, no. 19, May 2024, pp. 1–16. EBSCOhost, https://doi.org/10.1063/5.0197226.
APA
Valloire, H., Quéméré, P., Vaxelaire, N., Kuentz, H., Le Rhun, G., & Borowik, Ł. (2024). Enhancing ferroelectric characterization at nanoscale: A comprehensive approach for data processing in spectroscopic piezoresponse force microscopy. Journal of Applied Physics, 135(19), 1–16. https://doi.org/10.1063/5.0197226
Chicago
Valloire, H., P. Quéméré, N. Vaxelaire, H. Kuentz, G. Le Rhun, and Ł. Borowik. 2024. “Enhancing Ferroelectric Characterization at Nanoscale: A Comprehensive Approach for Data Processing in Spectroscopic Piezoresponse Force Microscopy.” Journal of Applied Physics 135 (19): 1–16. doi:10.1063/5.0197226.