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Simultaneous secondary electron microscopy in the scanning transmission electron microscope with applications for in situ studies.
- Source :
-
Microscopy . Apr2024, Vol. 73 Issue 2, p169-183. 15p. - Publication Year :
- 2024
Details
- Language :
- English
- ISSN :
- 20505698
- Volume :
- 73
- Issue :
- 2
- Database :
- Academic Search Index
- Journal :
- Microscopy
- Publication Type :
- Academic Journal
- Accession number :
- 177085417
- Full Text :
- https://doi.org/10.1093/jmicro/dfae007