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Soft X-ray reflectivity for YBa2Cu3O7−δ and La2/3Ca1/3MnO3 films

Authors :
Wu, X.S.
Jiang, S.S.
Cui, M.Q.
Zhu, P.P.
Gao, J.
Source :
Journal of Electron Spectroscopy & Related Phenomena. Jun2005, Vol. 144-147, p471-474. 4p.
Publication Year :
2005

Abstract

Abstract: The film of La2/3Ca1/3MnO3 (LCMO), YBa2Cu3O7−δ (YBCO) and YBCO/LCMO bi-layer were prepared by rf off-axis magnetic sputtering technique on SrTiO3 (STO) substrate. The structures, including the surface and interfacial morphology, the interfacial diffusion and so on, have been characterized by X-ray diffraction (XRD), auger electronic energy spectroscopy (AES) and atomic force microscopy (AFM). Through a 50–200eV energy range, a single layer of YBCO shows a very small reflectance (<2%), while a single layer of LCMO shows a higher reflectance of about 25% at the energy of about 75eV, which is much higher than that of metal W. Even higher reflectance (>50%) at about 75eV has been observed in the LCMO/YBCO bi-layers. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
03682048
Volume :
144-147
Database :
Academic Search Index
Journal :
Journal of Electron Spectroscopy & Related Phenomena
Publication Type :
Academic Journal
Accession number :
17680980
Full Text :
https://doi.org/10.1016/j.elspec.2005.01.284