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XPS and NEXAFS characterisation of plasma deposited vertically aligned N-doped MWCNT
- Source :
-
Diamond & Related Materials . Mar2005, Vol. 14 Issue 3-7, p891-895. 5p. - Publication Year :
- 2005
-
Abstract
- Abstract: This paper is dedicated to carbon nanotubes grown by electron cyclotron resonance plasma-enhanced chemical vapour deposition. It has been shown that carbon nanotubes (CNTs) can be grown at temperature as low as 550 °C by this technique. X-ray photoelectron spectroscopy and near-edge X-ray absorption fine structure spectroscopy were used to analyse nitrogen-doped CNTs. Independently of the synthesis temperature, about 4 at.% nitrogen are incorporated in the CNTs. A good correlation was found between XPS and NEXAFS results. Four components (397.3, 398.5, 400.8 and 402.5 eV) compose N 1s XPS spectra related to different chemical environments of nitrogen. This interpretation can be used as a simple check method of the presence of CNTs on as-deposited PECVD samples. [Copyright &y& Elsevier]
- Subjects :
- *SPECTRUM analysis
*CARBON
*NANOTUBES
*FULLERENES
Subjects
Details
- Language :
- English
- ISSN :
- 09259635
- Volume :
- 14
- Issue :
- 3-7
- Database :
- Academic Search Index
- Journal :
- Diamond & Related Materials
- Publication Type :
- Academic Journal
- Accession number :
- 17674067
- Full Text :
- https://doi.org/10.1016/j.diamond.2004.10.011