Simulating charged defects at database scale.

MLA

Shen, Jimmy-Xuan, et al. “Simulating Charged Defects at Database Scale.” Journal of Applied Physics, vol. 135, no. 14, Apr. 2024, pp. 1–11. EBSCOhost, https://doi.org/10.1063/5.0203124.

APA

Shen, J.-X., Voss, L. F., & Varley, J. B. (2024). Simulating charged defects at database scale. Journal of Applied Physics, 135(14), 1–11. https://doi.org/10.1063/5.0203124

Chicago

Shen, Jimmy-Xuan, Lars F. Voss, and Joel B. Varley. 2024. “Simulating Charged Defects at Database Scale.” Journal of Applied Physics 135 (14): 1–11. doi:10.1063/5.0203124.