Cite
Exploring mc‐Silicon Wafers: Utilizing Machine Learning to Enhance Wafer Quality Through Etching Studies.
MLA
Raji, Madhesh, et al. “Exploring Mc‐Silicon Wafers: Utilizing Machine Learning to Enhance Wafer Quality Through Etching Studies.” Crystal Research & Technology, vol. 59, no. 4, Apr. 2024, pp. 1–12. EBSCOhost, https://doi.org/10.1002/crat.202300279.
APA
Raji, M., Balakrishnapillai Suseela, S., Manikkam, S., Anbazhagan, G., Kutsukake, K., Thamotharan, K., Rajavel, R., Usami, N., & Perumalsamy, R. (2024). Exploring mc‐Silicon Wafers: Utilizing Machine Learning to Enhance Wafer Quality Through Etching Studies. Crystal Research & Technology, 59(4), 1–12. https://doi.org/10.1002/crat.202300279
Chicago
Raji, Madhesh, Sreeja Balakrishnapillai Suseela, Srinivasan Manikkam, Gowthami Anbazhagan, Kentaro Kutsukake, Keerthivasan Thamotharan, Ramadoss Rajavel, Noritaka Usami, and Ramasamy Perumalsamy. 2024. “Exploring Mc‐Silicon Wafers: Utilizing Machine Learning to Enhance Wafer Quality Through Etching Studies.” Crystal Research & Technology 59 (4): 1–12. doi:10.1002/crat.202300279.