Optimizing nano/micro satellite constellation lifecycle cost based on reliability after acceptance testing.

• A new constellation lifecycle cost optimization problem was introduced. • Useful insights to the satellite burn-in problem can guide satellite manufacturers. • Long testing durations are undesirable; testing can be traded off with number of satellites produced. • Combining burn-in, warranty and availability analysis opens new paths for constellation research. Constellation lifecycle costs are an important metric for constellation designers. Recurring costs of mega constellations in particular are large relative to the non-recurring costs, yet little attention has been given to the reduction of recurring costs. Moreover, few studies exist on the impacts of pre-launch activities such as satellite testing on subsequent operational reliability. We thus study the lifecycle cost impacts of environmental stress screening during acceptance testing to minimize constellation lifecycle costs. Parallels are drawn with the field of electronics testing, and costs arising from burn-in, replacement and availability are considered in our formulation. A single-objective cost minimization problem and a multi-objective cost and unavailability minimization problem are presented to capture different mission applications that require different objectives. The effects of system homogeneity and the use of sparing strategies are investigated. We propose genetic algorithms to solve the optimization problems and give some insight into how burn-in should be carried out for minimizing total costs. The optimization is also applied to a case study of a proposed mission scenario and the constellation lifecycle costs of an optimized burn-in plan are compared to those of a typical "reliability target" burn-in plan. The optimization resulted in lifecycle cost savings of around 19% while significantly reducing the burn-in duration, showing much promise in the burn-in cost optimization approach. [ABSTRACT FROM AUTHOR]