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Electron diffraction from elliptical nanotubes
- Source :
-
Chemical Physics Letters . Apr2005, Vol. 406 Issue 1-3, p106-110. 5p. - Publication Year :
- 2005
-
Abstract
- Abstract: A quantitative method for the structural determination by electron diffraction of nanotubes of elliptical cross-section is developed as a general case while the cylindrical nanotubes are treated as a special class. We found that the chiral indices of a carbon nanotube can always be measured from the electron diffraction pattern regardless if the nanotube is circular or elliptical. An experimental electron diffraction pattern from a partly-deformed carbon nanotube is also analyzed. Assisted with numerical simulations, it is determined that the observed carbon nanotube has chiral indices (15,7) with 8° tilt relative to the horizontal plane and eccentricity of 0.553. [Copyright &y& Elsevier]
- Subjects :
- *ELECTRON diffraction
*OPTICS
*NANOTUBES
*FULLERENES
Subjects
Details
- Language :
- English
- ISSN :
- 00092614
- Volume :
- 406
- Issue :
- 1-3
- Database :
- Academic Search Index
- Journal :
- Chemical Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 17639386
- Full Text :
- https://doi.org/10.1016/j.cplett.2005.02.103