Cross-linked polymer film on copper stubs as a reusable substrate enabling imaging and quantitative analyses of aluminosilicate particles.

Access issues to potable waters around the planet is the motivation for research in desalination technologies. One class of materials that is a research focus for desalination membranes are zeolites that are comprised of silicon (Si), aluminum (Al), and oxygen, and have structures that include regular pores of varying sizes dependent on the type of zeolite. A motivation for this study was to enable characterization of non-conductive materials containing Si or Al (e.g., zeolites) using scanning electron microscopy (SEM) and energy dispersive X-ray spectroscopy (EDS) techniques. To avoid significant background signals directly overlapping with these samples, common sample supports and preparation protocols involving Al or Si were precluded. Cross-linked polymer coatings applied via spin coating onto polished copper (Cu) stubs are shown to be durable for reuse even with the use of aggressive cleaning techniques between samples. SEM and EDS analyses of Cu stubs were performed before and after applying the polymer coating, after drop-cast application of zeolite particles and after their subsequent removal by sonication-based techniques. The data from those trials confirmed there was no background signal from Si or Al and no cross-contamination between samples during these analyses, enabling quantitation of Al and Si in the samples. [ABSTRACT FROM AUTHOR]