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X-ray analysis of Ag nanoparticles on Si wafer and influence of Ag nanoparticles on Si nanowire-based gas sensor.
- Source :
-
Applied Physics A: Materials Science & Processing . Apr2024, Vol. 130 Issue 4, p1-13. 13p. - Publication Year :
- 2024
-
Abstract
- Here, the room temperature deposition of silver (Ag) nanoparticles (NPs) on silicon (Si) substrate has been carried out by a simple chemical route to investigate their elastic and micro-structural properties. The theoretical X-ray peak profile analysis has been pursued through the Scherrer model, modified Scherrer model, modified Williamson–Hall model, size–strain plot model and Halder–Wagner model. The X-ray diffraction (XRD) analysis results in the crystalline nature of Ag NPs having nearer dodecahedron structure. The parameters including micro-strain, internal stress and energy density have been estimated for all reflection peaks of XRD. The findings show that the nano-crystalline size (NCS) estimated from all models is in reasonably good agreement. This analysis can pave the way for novel research avenues by comparing the estimated elastic and micro-structural properties of Ag NPs as a potential alternative tool to existing characterization techniques and helpful in fabricating different sizes of Ag–Si nanostructure-based gas-sensing devices. The influence of Ag nanoparticles on Si nanowire towards acetone gas sensor has been studied and achieved remarkable sensitivity 98.77% at 5 MHz frequency with operating temperature at 50 °C. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 09478396
- Volume :
- 130
- Issue :
- 4
- Database :
- Academic Search Index
- Journal :
- Applied Physics A: Materials Science & Processing
- Publication Type :
- Academic Journal
- Accession number :
- 176133115
- Full Text :
- https://doi.org/10.1007/s00339-024-07379-w