Influence of shallow traps on the kinetics of Optically Stimulated Luminescence of the Li and Ce ions co-doped MgB4O7 compound.

The presence of point defects associated with shallow traps has been identified as a limiting factor in the design of materials with desirable characteristics for applications such as scintillation and luminescence dosimetry, among others. In this context, this study aims to elucidate the dynamics inherent to the charge carriers in systems containing multiple traps and one single recombination centre. To unravel this complexity, we employed a synergetic approach combining Thermoluminescence (TL) and Optically Stimulated Luminescence (OSL) measurements with kinetic models. Specifically, for the Li and Ce co-doped MgB 4 O 7 , we verified that the electron population trapped in shallower traps exhibits a slower decay rate under optical stimulation compared to deeper traps. This behaviour led to a delay in the luminescence emission, as a result of charge re-trapping or even competition with other centres. This phenomenon can be attributed to its low photoionization cross-section associated with a high re-trapping rate, providing a rationale for these remarks. In addition, we observed that the shallow traps have a greater optical than thermal probability of being detrapped, indicating that they were not solely detrapped through thermal stimulation. Also, the magnitude of the thermal probability leads us to believe that there is an electron population different from zero in the conduction band at t = 0 (before optical stimulation). Lastly, this study paves the way for a deeper understanding of charge carrier dynamics in systems of multiple traps, improving the performance of existing materials for scintillation and dosimetry. • The electron populations trapped in shallower traps exhibited a slower decay rate under optical stimulation compared to intermediate and deep traps. • Shallow traps have a low photoionization cross-section and high probability of re-trapping. • Intermediate traps have a low probability of re-trapping, compared to shallow and deep traps. [ABSTRACT FROM AUTHOR]