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Calibration of second harmonic generation technique to probe the field-effect passivation of Si(100) with Al2O3 dielectric layers.

Authors :
Obeid, B.
Bastard, L.
Bouchard, A.
Aubriet, V.
Jouannic, K.
Le Cunff, D.
Gourhant, O.
Ionica, I.
Source :
Journal of Applied Physics. 3/7/2024, Vol. 135 Issue 9, p1-6. 6p.
Publication Year :
2024

Abstract

Optical second harmonic generation (SHG) can be employed to characterize the passivation quality of semiconducting material interfaces. The interface electric field (EDC) related to the existing charges at and near the interface, including the fixed oxide charges Qox, gives rise to the electric field induced second harmonic phenomenon. In this paper, we calibrate the SHG response for EDC measurement, using Al2O3/SiO2/Si(100) samples with different Qox. To perform this calibration, SHG and capacitance-voltage measurements (to access the electrical field of the samples) were made. The experimental results match well the simulated calibration curve, proving the potential of the SHG as stand-alone characterization technique for dielectric stacks on Si. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
135
Issue :
9
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
175915514
Full Text :
https://doi.org/10.1063/5.0188837