Absolute intensity calibration of samples at variable sample to detector distances in small angle X-ray scattering (SAXS)

AbstractSmall angle X-ray scattering (SAXS) is a widely used physical technique to characterize nanoscale materials. The absolute scattering intensity provides quantitative data to characterize the mass and density of the analyzed materials. However, the derivation of absolute scattering intensity usually requires the calibration of experimentally measured relative scattering intensity. The most common approach calibration employs standards with known differential cross sections. It is necessary to analyze the standard and samples under identical conditions, including the same distance from sample to detector. This study eliminates this limitation, i.e., the calibration may be achieved by measuring the standards and samples at different distances to the detector using variable sample locations. [ABSTRACT FROM AUTHOR]