Cite
Interior segment regrowth configurational-bias algorithm for the efficient sampling and fast relaxation of coarse-grained polyethylene and polyoxyethylene melts on a high coordination lattice.
MLA
Rane, Sagar S., and Wayne L. Mattice. “Interior Segment Regrowth Configurational-Bias Algorithm for the Efficient Sampling and Fast Relaxation of Coarse-Grained Polyethylene and Polyoxyethylene Melts on a High Coordination Lattice.” Journal of Chemical Physics, vol. 122, no. 23, June 2005, p. 234913. EBSCOhost, https://doi.org/10.1063/1.1940057.
APA
Rane, S. S., & Mattice, W. L. (2005). Interior segment regrowth configurational-bias algorithm for the efficient sampling and fast relaxation of coarse-grained polyethylene and polyoxyethylene melts on a high coordination lattice. Journal of Chemical Physics, 122(23), 234913. https://doi.org/10.1063/1.1940057
Chicago
Rane, Sagar S., and Wayne L. Mattice. 2005. “Interior Segment Regrowth Configurational-Bias Algorithm for the Efficient Sampling and Fast Relaxation of Coarse-Grained Polyethylene and Polyoxyethylene Melts on a High Coordination Lattice.” Journal of Chemical Physics 122 (23): 234913. doi:10.1063/1.1940057.