The heat dissipation path of self-heating effects for the SOI MOSFET by considering the BOX layer and the TiN barrier layer.

MLA

Li, Y. F., et al. “The Heat Dissipation Path of Self-Heating Effects for the SOI MOSFET by Considering the BOX Layer and the TiN Barrier Layer.” Journal of Physics D: Applied Physics, vol. 57, no. 17, Apr. 2024, pp. 1–8. EBSCOhost, https://doi.org/10.1088/1361-6463/ad2006.

APA

Li, Y. F., Xu, L. D., Ni, T., Wang, J. J., Gao, L. C., Li, D. L., Ma, Q. G., Wang, Z. J., Zeng, C. B., Li, B., & Luo, J. J. (2024). The heat dissipation path of self-heating effects for the SOI MOSFET by considering the BOX layer and the TiN barrier layer. Journal of Physics D: Applied Physics, 57(17), 1–8. https://doi.org/10.1088/1361-6463/ad2006

Chicago

Li, Y F, L D Xu, T Ni, J J Wang, L C Gao, D L Li, Q G Ma, et al. 2024. “The Heat Dissipation Path of Self-Heating Effects for the SOI MOSFET by Considering the BOX Layer and the TiN Barrier Layer.” Journal of Physics D: Applied Physics 57 (17): 1–8. doi:10.1088/1361-6463/ad2006.