Fundamental solution for functionally graded Magneto-Electro-Elastic plane.

Cracked functionally graded magneto-electro-elastic materials (MEEM) are considered here. The material is subjected to anti-plane mechanical and in-plane electric and magnetic external load. To improve the computational speed a new derivation of fundamental solution by the Fourier transform is presented. The obtained result is used further to solve various crack problems in macro and nano level based on the BIEM. [ABSTRACT FROM AUTHOR]