Variation in Refractive Index and Extinction Coefficient of a Very Thin Copper Film by Thermal Annealing: an Ellipsometric Approach.

A pure experiment-based work was conducted to investigate the optical characteristics of a thin absorbing singlelayer copper film at various annealing temperatures. The study also systematically examined the utilization of spectroscopic ellipsometry as an effective tool for fine-tuning the optical constants of thin films, particularly for achieving specific refractive index (n) and extinction coefficient (k) values. The measurement and analysis involved a thermally deposited thin nanosized single-layer copper film on a glass substrate, along with a spectroscopic ellipsometer. [ABSTRACT FROM AUTHOR]