Réseaux denses de défauts linéaires interfaciaux et dislocations de Somigliana

Abstract: . A crystalline interface is often covered by a dense network of linear defects with a (pseudo) biperiodic geometry. The elastic field of this network is calculated by thinking the interface as paved by adjacent Somigliana dislocations. The analysis of a portion of an erratic zigzag line of a (001)Si low angle twist boundary, observed in two-beam transmission electron microscopy, is given as an example. To cite this article: A. Boussaid et al., C. R. Physique 6 (2005). [Copyright &y& Elsevier]