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Investigating the Thickness-Dependent Scintillator-PMT Interface Reflection Coefficients with GAGG:Ce3+ Crystals Using the Dual-PMT Setup.
- Source :
-
EPJ Web of Conferences . 11/21/2023, Vol. 288, p1-5. 5p. - Publication Year :
- 2023
-
Abstract
- Recently, it has been shown through both Monte Carlo simulations and experiments that scintillator-PMT interface reflection coefficients could depend on crystal thickness. It has been argued that the thickness-dependency on the interface reflection coefficient is a result of bulk attenuation and surface reflections. So far, only LYSO:Ce3+ scintillators have been tested to investigate thickness-dependent reflection coefficients. In this work, the simulations and experiments are extended to GAGG:Ce3+ crystals. Moreover, a new experimental technique (the dualPMT setup) has been tested to measure the interface reflection coefficients, and it has been shown through the dual-PMT setup that GAGG:Ce3+-PMT interface reflection coefficients are thickness-dependent with more than 1σ confidence. These results are also supported with extensive Monte Carlo simulations. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 21016275
- Volume :
- 288
- Database :
- Academic Search Index
- Journal :
- EPJ Web of Conferences
- Publication Type :
- Conference
- Accession number :
- 173805265
- Full Text :
- https://doi.org/10.1051/epjconf/202328810015