Leakage current induced erratic switching in Si avalanche bipolar junction transistors under overvoltage states.

MLA

Wen, Kaijun, et al. “Leakage Current Induced Erratic Switching in Si Avalanche Bipolar Junction Transistors under Overvoltage States.” Journal of Applied Physics, vol. 134, no. 17, Nov. 2023, pp. 1–11. EBSCOhost, https://doi.org/10.1063/5.0169866.

APA

Wen, K., Liang, L., Zhang, Z., Han, L., & Yang, Z. (2023). Leakage current induced erratic switching in Si avalanche bipolar junction transistors under overvoltage states. Journal of Applied Physics, 134(17), 1–11. https://doi.org/10.1063/5.0169866

Chicago

Wen, Kaijun, Lin Liang, Ziyang Zhang, Lubin Han, and Zewei Yang. 2023. “Leakage Current Induced Erratic Switching in Si Avalanche Bipolar Junction Transistors under Overvoltage States.” Journal of Applied Physics 134 (17): 1–11. doi:10.1063/5.0169866.