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Composition-dependent crystal structure, dielectric properties and temperature stability of the (1-x)CaZrO3-xSrTiO3 paraelectric thin films.
- Source :
-
Journal of the European Ceramic Society . Feb2024, Vol. 44 Issue 2, p914-923. 10p. - Publication Year :
- 2024
-
Abstract
- The (1-x)CaZrO 3 -xSrTiO 3 solid-solution thin films were prepared with different compositions from x = 0.05 to x = 0.45. The as-prepared thin films experienced such a crystal structure transition process from orthorhombic to pseudo cubic and then to cubic as the x increases. Among the as-prepared films, the smallest expansion ratio of lattice volume with temperatures, and the highest temperature stability of dielectric response and leakage current density at high voltage were found in the x = 0.3 thin films. The relationship between the tolerance factor and the temperature stability was analyzed from the crystal structure dependence of the absorbed thermal energy distribution. Finally, the x = 0.3 thin films were developed into thin-film capacitors, which showed high DC resistance and uniform capacitance properties. The result also shows that high temperature stability of the perovskite-type paraelectric thin films could be realized through the phase boundary design, and further improved by optimizing the temperature stability of the lattice structure. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 09552219
- Volume :
- 44
- Issue :
- 2
- Database :
- Academic Search Index
- Journal :
- Journal of the European Ceramic Society
- Publication Type :
- Academic Journal
- Accession number :
- 173372308
- Full Text :
- https://doi.org/10.1016/j.jeurceramsoc.2023.09.032