High-resolution x-ray microtomography at 200 keV region.

High-resolution X-ray microtomography at 200 keV region was developed at bending magnet beamline BL28B2 in SPring-8. In this study, synchrotron radiation based high-energy white X-rays with the peak energy of around 200 keV was employed. To achieve high-resolution X-ray microtomography at 200 keV region, contribution of the effective thickness of the scintillator in a visible-light conversion type X-ray imaging detector was experimentally evaluated by changing the thickness of the scintillator and the aperture size of a lens system used as visible-light optics. The thin scintillator with smaller aperture size provided a better spatial resolution. Even in the thick scintillator, the spatial resolution could be improved by increasing the effective depth of focus of the lens system on the scintillator with smaller aperture size. As a result, t-resolution X-ray microtomography, a multi-scale observation of a D-size battery was conducted. The local fine structure as well as the entire shape of the battery could be clearly observed. [ABSTRACT FROM AUTHOR]