Cite

Machine learning based prediction model for single event burnout hardening design of power MOSFETs.

MLA

Liao, Xinfang, et al. “Machine Learning Based Prediction Model for Single Event Burnout Hardening Design of Power MOSFETs.” Microelectronics Journal, vol. 139, Sept. 2023, p. N.PAG. EBSCOhost, https://doi.org/10.1016/j.mejo.2023.105893.



APA

Liao, X., Xu, C., Liu, Y., Wang, C., Chen, D., & Yang, Y. (2023). Machine learning based prediction model for single event burnout hardening design of power MOSFETs. Microelectronics Journal, 139, N.PAG. https://doi.org/10.1016/j.mejo.2023.105893



Chicago

Liao, Xinfang, Changqing Xu, Yi Liu, Chen Wang, Dongdong Chen, and Yintang Yang. 2023. “Machine Learning Based Prediction Model for Single Event Burnout Hardening Design of Power MOSFETs.” Microelectronics Journal 139 (September): N.PAG. doi:10.1016/j.mejo.2023.105893.