Cite
Real-Time Change Detection for Automated Test Socket Inspection Using Advanced Computer Vision and Machine Learning.
MLA
Edwards, Chris, et al. “Real-Time Change Detection for Automated Test Socket Inspection Using Advanced Computer Vision and Machine Learning.” IEEE Transactions on Semiconductor Manufacturing, vol. 36, no. 3, Aug. 2023, pp. 332–39. EBSCOhost, https://doi.org/10.1109/TSM.2023.3273175.
APA
Edwards, C., Vaske, A., McDaniel, N., Pradhan, D., & Panda, D. (2023). Real-Time Change Detection for Automated Test Socket Inspection Using Advanced Computer Vision and Machine Learning. IEEE Transactions on Semiconductor Manufacturing, 36(3), 332–339. https://doi.org/10.1109/TSM.2023.3273175
Chicago
Edwards, Chris, Alex Vaske, Nathan McDaniel, Dipali Pradhan, and Debashis Panda. 2023. “Real-Time Change Detection for Automated Test Socket Inspection Using Advanced Computer Vision and Machine Learning.” IEEE Transactions on Semiconductor Manufacturing 36 (3): 332–39. doi:10.1109/TSM.2023.3273175.