Secondary ion mass spectrometry characterization of matrix composition in topological crystalline insulator [formula omitted].

This study explores the use of Secondary Ion Mass Spectrometry (SIMS) to accurately measure the content of Pb 1 − x Sn x Te , a new class of electronic materials known as Topological Crystalline Insulators (TCIs). We analyzed the SIMS signal ratios of SnCs + / PbCs + and Sn ± / Pb ± in thin layers and determined the calibration curves necessary to estimate the exact amount of content in this ternary compound. Additionally, we investigated the matrix effect and performed depth profiling to obtain a more precise determination of the content. These findings contribute to the understanding and development of TCIs, and highlight the potential of SIMS for accurate content determination in ternary compounds. • Calibration curve for Secondary Ion Mass Spectrometry were developed for ternary compounds of Pb 1 − x Sn x Te. • The comparison of matrix effect between positive and negative secondary ions. • Cs cluster method gives the most proper results for determining the matrix composition. [ABSTRACT FROM AUTHOR]