Exploitation of OTFTs variability for PUFs implementation and impact of aging.

• Commercial OTFTs have been characterized to evaluate their variability and reliability and their implementation as PUFs. • The large TZV of OTFTs can be exploited to implement binarized I D -based PUFs that exhibit good Uniformity and Uniqueness. • The reliability of the PUFs has been preliminary evaluated, considering device aging during an HCI-like stress. • Although the shift of the device current during its operation could be a drawback. It decreases with the stress time. • The application of a stress previously to the PUF operation may be beneficial to its reliability. Commercial Organic Thin Film Transistors (OTFT) have been characterized to evaluate their variability and reliability. The feasibility of implementing Physical Unclonable Functions (PUFs) based on these devices has been evaluated, taking advantage of the high variation in the electrical characteristics among different OTFTs. The eventual impact of device aging on PUFs reliability has been preliminary explored. [ABSTRACT FROM AUTHOR]