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Treating chemical mechanical polishing (CMP) wastewater by electro-coagulation-flotation process with surfactant

Authors :
Hu, C.Y.
Lo, S.L.
Li, C.M.
Kuan, W.H.
Source :
Journal of Hazardous Materials. Apr2005, Vol. 120 Issue 1-3, p15-20. 6p.
Publication Year :
2005

Abstract

Abstract: The effect of surfactants on the treatment of chemical mechanical polishing (CMP) wastewater by electro-coagulation-flotation (ECF) process was studied. Two surfactants, cetyltrimethylammonium bromide (CTAB) and sodium dodecylsulfate (SDS) were employed in this study to compare the effect of cationic (CTAB) and anodic (SDS) surfactants on ECF. The cationic surfactant can enhance the removal of the turbidity, but anodic surfactant cannot. It can be explained by the hetero-coagulation theory. Moreover, the addition of CTAB in CMP wastewater can reduce the sludge volume and the flotation/sedimentation time in ECF process. The residual turbidity and dissolved silicon dropped with the increase of charge loading. No CTAB pollution problem exists after the ECF process. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
03043894
Volume :
120
Issue :
1-3
Database :
Academic Search Index
Journal :
Journal of Hazardous Materials
Publication Type :
Academic Journal
Accession number :
16873327
Full Text :
https://doi.org/10.1016/j.jhazmat.2004.12.038