Beyond Nanoscopes.

The article reports that a team at Oak Ridge National Laboratory in Tennessee recently set a new record for imaging very small objects --0.06 nanometer. The feat was performed thanks to an image-enhancing technology known as aberration correction. To test the process, the team, led by materials scientist Stephen Pennycook, made an image of a silicon crystal using a 300-kilovolt scanning transmission electron microscope. The researchers hope that such images will help nanotechnologists better understand the properties and behavior of material at the nanoscale.