Back to Search Start Over

A configurable control flow error detection method based on basic block repartition.

Authors :
Yan, Zujia
Zhuang, Yi
Zhang, Qianwen
Gu, Jingjing
Guo, Liye
Source :
Microelectronics Reliability. Aug2023, Vol. 147, pN.PAG-N.PAG. 1p.
Publication Year :
2023

Abstract

Radiation-induced soft errors have emerged as a critical issue that must be addressed in fields such as aerospace, where control flow errors they cause could lead to catastrophic consequences. However, existing control flow errors detection methods based on signature analysis typically use a single type of signature to record predecessor–successor relationships, which has limited expressive power and struggles to balance program residual failure rate and time overhead. In response to this, we employ a basic block repartitioning technique to adjust the control flow graph of a program to conform to jump rules we set, and design a novel signature analysis scheme that combines node type signatures with predecessor–successor signatures to detect control flow errors inter basic block. We also improve the signatures mechanism to detect control flow errors intra basic block and inter procedures, thus providing the ability to detect these two types of control flow errors and allowing for flexible configuration based on the reliability requirements of the program. Experimental results show that compared to baselines, the proposed method can ensure a low residual failure rate while maintaining a low time overhead. • A repartition method to adjust the structure of program control flow graphs. • Node type signatures represent the structural information of control flow graphs. • Readjust signatures to detect errors intra basic blocks and inter procedures. • Detection methods can be chosen according to the reliability requirement. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00262714
Volume :
147
Database :
Academic Search Index
Journal :
Microelectronics Reliability
Publication Type :
Academic Journal
Accession number :
165470413
Full Text :
https://doi.org/10.1016/j.microrel.2023.115070