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FOUR-DIMENSIONAL SCANNING TRANSMISSION ELECTRON MICROSCOPY: PART I: IMAGING, STRAIN MAPPING, AND DEFECT DETECTION.
- Source :
-
Electronic Device Failure Analysis . Aug2023, Vol. 25 Issue 3, p12-22. 10p. - Publication Year :
- 2023
-
Abstract
- The article focuses on four-dimensional scanning transmission electron microscopy (4D-STEM) as a new analytical technique for high-resolution materials characterization. Topics discussed include image generation from 4D datasets using virtual detectors, the use of 4D-STEM for strain measurements, and the challenges and advancements in the field.
Details
- Language :
- English
- ISSN :
- 15370755
- Volume :
- 25
- Issue :
- 3
- Database :
- Academic Search Index
- Journal :
- Electronic Device Failure Analysis
- Publication Type :
- Academic Journal
- Accession number :
- 165132895
- Full Text :
- https://doi.org/10.31399/asm.edfa.2023-3.p012