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The influence of thermal cycling on the activation energy of conduction electrons and filament temperature in Pt/NiOx/Pt ReRAMs.
- Source :
-
Applied Physics Letters . 6/19/2023, Vol. 122 Issue 25, p1-5. 5p. - Publication Year :
- 2023
-
Abstract
- We investigate the electrical and thermal conduction properties of low- (ON) and high-resistance (OFF) states in Pt/NiOx/Pt based unipolar ReRAM devices during cooling and warming cycles between 300 and 180 K. The conduction electron-trap activation energy was found to decrease upon warming. Although thermal cycling did not significantly affect the average resistance-temperature coefficient of the Pt diffused conductive filaments in the system, the ON-state resistance fluctuations increase at high temperatures, indicating that ambient temperature significantly affects the sizes of the formed filaments. The mechanism behind these thermally activated changes is discussed. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 122
- Issue :
- 25
- Database :
- Academic Search Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 164486149
- Full Text :
- https://doi.org/10.1063/5.0151967