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Mapping CPAT I/O Data to CIM and Setting the Multiplicity of Attributes and Associations.

Authors :
Dozaki, Takashi
Otani, Tetsuo
Source :
IEEJ Transactions on Electrical & Electronic Engineering. May2023, Vol. 18 Issue 6, p1015-1022. 8p.
Publication Year :
2023

Abstract

This study demonstrates the mapping of input/output (I/O) data of Central Research Institute of Electric Power Industry's Power System Analysis Tool (CPAT) with the Common Information Model (CIM) and the setting of the multiplicity of attributes and associations. The mapping describes which CIM classes defined in IEC 61970‐301 Edition 7.0 and IEC 61970‐302 Edition 1.0 correspond to which I/O data of CPAT. In addition, the multiplicity of their attributes and associations is determined by requirements of the I/O data of CPAT. © 2023 Institute of Electrical Engineers of Japan. Published by Wiley Periodicals LLC. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
19314973
Volume :
18
Issue :
6
Database :
Academic Search Index
Journal :
IEEJ Transactions on Electrical & Electronic Engineering
Publication Type :
Academic Journal
Accession number :
163714799
Full Text :
https://doi.org/10.1002/tee.23798