A Coupling Mechanism between Flicker Noise and Hot Carrier Degradations in FinFETs.

MLA

Liu, Minghao, et al. “A Coupling Mechanism between Flicker Noise and Hot Carrier Degradations in FinFETs.” Nanomaterials (2079-4991), vol. 13, no. 9, May 2023, p. 1507. EBSCOhost, https://doi.org/10.3390/nano13091507.

APA

Liu, M., Sun, Z., Lu, H., Shen, C., Zhang, L., Wang, R., & Huang, R. (2023). A Coupling Mechanism between Flicker Noise and Hot Carrier Degradations in FinFETs. Nanomaterials (2079-4991), 13(9), 1507. https://doi.org/10.3390/nano13091507

Chicago

Liu, Minghao, Zixuan Sun, Haoran Lu, Cong Shen, Lining Zhang, Runsheng Wang, and Ru Huang. 2023. “A Coupling Mechanism between Flicker Noise and Hot Carrier Degradations in FinFETs.” Nanomaterials (2079-4991) 13 (9): 1507. doi:10.3390/nano13091507.