Data analysis for the characterization of nanoparticles with single particle inductively coupled plasma mass spectrometry: From microsecond to millisecond dwell times.

Single particle-inductively coupled plasma-mass spectrometry (SP-ICP-MS) has become a powerful technique for the characterization of nanoparticles (NPs). However, the accuracy of the characterization of NPs by SP-ICP-MS is greatly affected by the data acquisition rate and the way of data processing. For SP-ICP-MS analysis, ICP-MS instruments typically apply microsecond to millisecond dwell times (10 μs–10 ms). Considering the duration of one nanoparticle event in the detector is 0.4–0.9 ms, NPs will show different data forms when working with microsecond and millisecond dwell times. In this work, the effects of dwell times from microsecond to millisecond (50 μs, 100 μs, 1 ms and 5 ms) on the data forms in SP-ICP-MS analysis are discussed. The data analysis and data processing for different dwell times is discussed in detail, including the measurement of transport efficiency (TE), the distinction of signal and background, the evaluation of diameter limit of detection (LOD d) and the quantification of mass, size and particle number concentration (PNC) of NPs. This work provides data support for the data processing process and aspects to be considered in the characterization of NPs by SP-ICP-MS, which is expected to provide guidance and reference for researchers in SP-ICP-MS analysis. [Display omitted] • The effect of dwell times on data acquisition quality is investigated in SP-ICP-MS analysis. • The differences in data processing between millisecond and microsecond dwell times are compared and discussed in detail. • Particle size method using standard NPs and standard solutions can be used to evaluate transport efficiency accurately. • A methodology set for the characterization of nanoparticles using SP-ICP-MS is provided. [ABSTRACT FROM AUTHOR]